scanning ion microscope

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• Scanning helium microscope — may refer to: * Scanning Helium Ion Microscope *Atomic nanoscope, which was proposed and discussed in the literature, but is not yet competitive with optical microscope, electron microscope, Scanning Helium Ion Microscope and various scanning… …   Wikipedia

• Scanning electron microscope — These pollen grains taken on an SEM show the characteristic depth of field of SEM micrographs …   Wikipedia

• Scanning tunneling microscope — Image of reconstruction on a clean Gold(100) surface …   Wikipedia

• Scanning Helium Ion Microscope — A Scanning Helium Ion Microscope (SHIM) is a new imaging technology based on a scanning helium ion beam. [ [http://nanotechwire.com/news.asp?nid=2120 ntid=121 pg=1 Nanotechwire press release announcing new microscope, retrieved December 13, 2006] …   Wikipedia

• Scanning Helium Ion Microscope — Ein Helium Ionen Mikroskop (auch: Scanning Helium Ion Microscope, SHIM) ist ein bildgebendes Verfahren, welches darauf basiert, dass ein Helium Ionen Strahl das zu untersuchende Objekt abtastet[1]. Das Verfahren ähnelt dem eines… …   Deutsch Wikipedia

• Scanning ion-conductance microscopy — The scanning ion conductance microscope (SICM) consists of an electrically charged glass micro or nanopipette probe filled with electrolyte lowered toward the surface of the sample (which is non conducting for ions) in an oppositely charged bath… …   Wikipedia

• Near-field scanning optical microscope — Near field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. This is done by placing the detector very… …   Wikipedia

• Electrochemical scanning tunneling microscope — The electrochemical scanning tunneling microscope, or ESTM, was invented in 1988 by Kingo Itaya in Japan. With ESTM, the structures of surfaces and electrochemical reactions in solid liquid interfaces can be observed at atomic or molecular scales …   Wikipedia

• Scanning voltage microscopy — (SVM) sometimes also called nanopotentiometry is a scientific experimental technique based on atomic force microscopy. A conductive probe, usually only a few nanometers wide at the tip, is placed in full contact with an operational electronic or… …   Wikipedia

• microscope — /muy kreuh skohp /, n. 1. an optical instrument having a magnifying lens or a combination of lenses for inspecting objects too small to be seen or too small to be seen distinctly and in detail by the unaided eye. 2. (cap.) Astron. the… …   Universalium

• Scanning probe microscopy — Part of a series of articles on Nanotechnology …   Wikipedia